• DocumentCode
    729049
  • Title

    Fast data pattern based electromagnetic interference evaluation for IC packaging

  • Author

    Huang, Nick K. H. ; Li Jun Jiang

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    272
  • Lastpage
    274
  • Abstract
    Electromagnetic interference (EMI) is becoming more serious when the data rate of the digital system continues increasing. However, its modeling and analysis are very challenging. In this paper, a novel electromagnetic superposition method is developed to model the IC packaging electromagnetic emission. It employs the equivalence principle to obtain the electromagnetic field response over a broad spectrum. Then it uses the linear property of the passive parasitic system to superpose the contribution of different signals on the packaging. As a result, with certain pre-calculations, it is convenient to compute the electromagnetic emission efficiently from different signals with various data pattern combinations, which benefits identifying worst case scenario. In addition, data reconstruction can be evaluated through the phase shift, which simplifies identifying the EMI of any pulse bit pattern. This work provides a basic modeling framework for comprehensive radiation studies.
  • Keywords
    electromagnetic fields; electromagnetic interference; equivalent circuits; integrated circuit packaging; EMI; IC packaging electromagnetic emission; data pattern combinations; data rate; data reconstruction; digital system; electromagnetic field response; electromagnetic interference; electromagnetic superposition method; equivalence principle; passive parasitic system; phase shift; pulse bit pattern; Electromagnetic interference; Electromagnetics; Integrated circuit modeling; Integrated circuit packaging; Surface reconstruction; Surface treatment; Wires; EM radiated emission; EMI; IC packaging; cavity mode; linear superposition; via trace radiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175254
  • Filename
    7175254