Design of the multifunction IC-EMC test board with off-board probes for evaluating a microcontroller

Author

Yin-Cheng Chang ; Ping-Yi Wang ; Hsu, Shawn S. H. ; Mao-Hsu Yen ; Yen-Tang Chang ; Chiu-Kuo Chen ; Da-Chiang Chang

Author_Institution

Inst. of Electron. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan

fYear

2015

fDate

26-29 May 2015

Firstpage

223

Lastpage

226

Abstract

A multifunction test board is designed for a microcontroller (MCU) testing. This board can be used to verify the function of the MCU by running several basic instructions. Furthermore, six different IC-EMC measurements complied with IEC standards can be performed on the same board by careful design and the preservation of test points with certified off-board probes. The experimental results show the capability of providing the confident measurements up to 1 GHz. Meanwhile, the cost of performing a bunch of different testing methods on implementing various test boards is reduced.

Keywords

electromagnetic compatibility; integrated circuit measurement; integrated circuit testing; microcontrollers; test equipment; IC-EMC measurements; IC-EMC test board; IEC standards; MCU testing; microcontroller testing; multifunction test board; off-board probes; Boards; Electromagnetic compatibility; IEC standards; Insertion loss; Integrated circuits; Probes; electromagnetic compatibility (EMC); emission; immunity; integrated circuit (IC); microcontroller (MCU);

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on

Conference_Location

Taipei

Print_ISBN

978-1-4799-6668-4

Type

conf

DOI

10.1109/APEMC.2015.7175301

Filename

7175301