Title :
High dip insertion loss due to periodic defect structure in high speed transmission line
Author :
Dau-Chyrh Chang ; Hsiao-Bin Liang ; Jian-Ren Wang ; Vito Chen ; Jun-Pin Zhang ; Yo-Sheng Lin
Author_Institution :
Oriental Inst. of Technol., Taipei, Taiwan
Abstract :
Periodic impedance caused by periodic structure in transmission lines is simulated by high frequency 3-D EM simulators and RF/MMW circuit simulator. From the simulated data, the dip trend of insertion loss, which is also called as suck-out effect of high speed bulk cable, is presented. A simplified N-section LC lumped-circuit model with periodic circuit elements interpreting the periodic structure of transmission line is proposed for describing the dip trend, suck-out effect, of insertion loss. With proper number of sections, under the condition of quasi-static, the lumped circuit model could also perform the suck-out effect due to the periodic structure up to several tens GHz frequency range.
Keywords :
LC circuits; telecommunication transmission lines; N-section LC lumped-circuit model; RF-MMW circuit simulator; high dip insertion loss; high frequency 3D EM simulator; high speed transmission line; insertion loss; periodic defect structure; suck-out effect; Insertion loss; Integrated circuit modeling; Market research; Microstrip; Periodic structures; Power transmission lines; Propagation losses;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
DOI :
10.1109/APEMC.2015.7175347