Title :
Measurements of transverse conversion loss for evaluating EM immunity of twisted-pair cable
Author :
Patel, Arvind C. ; Yu Song Meng ; Pandya, Harshang N. ; Yueyan Shan
Author_Institution :
Psiber Data Pte. Ltd., Singapore, Singapore
Abstract :
This paper presents some research works on fast and accurate measurements of a key parameter, transverse conversion loss (TCL), for characterizing the balance of a twisted-pair cable. The TCL is an important indicator of electromagnetic noise immunity and emission characteristics of a twisted-pair copper cable. Performance of a field tester for industry applications has been evaluated with reference to a 4-port vector network analyzer (with fixtures) in laboratory. The relationship between the TCL and the balance of a twisted-pair cable has also been investigated.
Keywords :
copper; immunity testing; network analysers; twisted pair cables; TCL measurement; electromagnetic noise immunity; field tester; industry applications; transverse conversion loss measurement; twisted-pair cable EM immunity evaluation; twisted-pair copper cable emission characteristics; vector network analyzer; Cable shielding; Communication cables; Copper; Electromagnetic interference; Fixtures; Loss measurement; Wires;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
DOI :
10.1109/APEMC.2015.7175353
