• DocumentCode
    729144
  • Title

    Analysis of multiple discharge events at a small gap exposed by fluctuated static E-fields

  • Author

    Honda, Masamitsu

  • Author_Institution
    Impulse Phys. Lab., Inc., Tokyo, Japan
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    616
  • Lastpage
    619
  • Abstract
    This paper reports charge induction phenomena caused by fluctuated static E-fields and multiple discharge phenomena at a small gap object triggered by the induced charge. A multiple discharge events were experimentally confirmed at the floating small gap, such as a 50μm gap width.
  • Keywords
    electromagnetic induction; electrostatic discharge; charge induction phenomena; fluctuated static E-field; multiple discharge event analysis; Discharges (electric); Electrostatic discharges; Immune system; Metals; Monitoring; Noise; Sparks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175370
  • Filename
    7175370
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=729144