Title :
Analysis of multiple discharge events at a small gap exposed by fluctuated static E-fields
Author :
Honda, Masamitsu
Author_Institution :
Impulse Phys. Lab., Inc., Tokyo, Japan
Abstract :
This paper reports charge induction phenomena caused by fluctuated static E-fields and multiple discharge phenomena at a small gap object triggered by the induced charge. A multiple discharge events were experimentally confirmed at the floating small gap, such as a 50μm gap width.
Keywords :
electromagnetic induction; electrostatic discharge; charge induction phenomena; fluctuated static E-field; multiple discharge event analysis; Discharges (electric); Electrostatic discharges; Immune system; Metals; Monitoring; Noise; Sparks;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
DOI :
10.1109/APEMC.2015.7175370
