• DocumentCode
    729157
  • Title

    Spatially-resolved near-field diagnosis of differential signaling performance for wireless device RFI/EMC applications

  • Author

    Kai-Syuan Chen ; Yu-Hao Liu ; Tzyy-Sheng Horng

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    551
  • Lastpage
    553
  • Abstract
    This paper presents a method to spatially diagnose amplitude and phase imbalances of high-frequency/high-speed differential signaling on a wireless device with a high resolution near-field scanning system. The principle of measuring the complex-valued magnetic near fields with vector network analyzer (VNA) is discussed. Then the measured complex-valued magnetic near fields over several differential circuits are used to study the radio-frequency interference (RFI) and electromagnetic compatibility (EMC) issues related to these circuits in a wireless device that is under a working state.
  • Keywords
    electromagnetic compatibility; magnetic field measurement; near-field communication; network analysers; radio equipment; radiofrequency interference; telecommunication signalling; EMC; RFI; VNA; complex-valued magnetic near field measurement; differential signaling performance spatially-resolved near-field diagnosis; electromagnetic compatibility; high resolution near-field scanning system; high-frequency differential signaling; high-speed differential signaling; radiofrequency interference; vector network analyzer; wireless device RFI-EMC applications; Current measurement; Electromagnetic compatibility; Magnetic circuits; Magnetic field measurement; Microstrip; Probes; Wireless communication; Differential signaling; complex-valued near field measurement system; differential imbalances; radiated emissions; vector network analyser (VNA);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175386
  • Filename
    7175386