High frequency response sensitivity of electrically large enclosure with aperture and its statistical analysis method

In this paper, the high frequency response sensitivity (HFRS) of the electromagnetic (EM) environment characteristics inside the electrically large enclosure with aperture under the external EM radiation and its corresponding statistical analysis method are discussed. Because of the immense computational cost due to the electrically large size and HFRS, it is difficult to assess the universal characteristics of the electromagnetic environment inside the enclosure according to the deterministic solution obtained by full wave analysis. The HFRS corresponding to the perturbations of the external excitation frequency and of the enclosure structure (equivalent to boundary conditions) are illustrated respectively. The space field distributions (the deterministic results) and corresponding probability distribution functions (PDFs) (the statistical results) of |E| inside the enclosure are given under different conditions. In the case of high frequency, the small changes of external excitation or geometric/physical structure of the enclosure can lead to great changes of the EM field distribution inside the enclosure, but its corresponding statistical characteristics are relatively stable. Therefore, adopting statistical method to analyse and describe the electromagnetic environment inside the electrically large enclosure is more reasonable. As soon as the modelling of the statistical characteristics is performed, the electromagnetic environment inside the enclosure can be reconstructed quickly, avoiding the high-cost full wave analysis.