Title :
On-chip integrated magnetic thin-film solution to countermeasure digital noise on RF IC
Author :
Yamaguchi, Masahiro ; Tanaka, Satoshi ; Endo, Yasushi ; Muroga, Sho ; Nagata, Makoto
Author_Institution :
Dept. of Electr. Eng., Tohoku Univ., Sendai, Japan
Abstract :
Crossed anisotropy amorphous Co85Zr3Nb12 thin film with total magnetic thickness of 2.0 μm is deposited on to the passivation of a test IC chip to accommodate intra IC chip level digital-to-RF noise suppression and telecommunication performance simultaneously. This technology is applicable to other frequency band in 0.41 to 3 GHz by using Co85-(x+y)Zr3+xNb12+y(x: 0-5.5, y: 0-11.0) film. In-band spurious tone is attenuated by 10 dB and the minimum input power level to meet the 3GPP criteria is improved by 8 dB. Intra electromagnetic coupling analysis from digital to RF circuits within the bandwidth of wireless channels have clarified that the magnetic film suppressed conduction noise in on-chip wires.
Keywords :
integrated circuit interconnections; integrated circuit noise; integrated circuit testing; interference suppression; passivation; radiofrequency integrated circuits; thin film circuits; wireless channels; 3GPP; Co85Zr3Nb12; IC chip level digital-to-RF noise suppression; RFIC; crossed anisotropy amorphous thin film; digital noise; electromagnetic coupling analysis; frequency 0.41 GHz to 3 GHz; on-chip integrated magnetic thin-film; size 2.0 mum; test IC chip; wireless channel; Anisotropic magnetoresistance; Magnetic films; Magnetic resonance; Noise; Permeability; Radio frequency;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4799-6668-4
DOI :
10.1109/APEMC.2015.7175409
