DocumentCode :
729220
Title :
Read optimized MRAM with separate read-write paths based on concerted operation of magnetic tunnel junction with correlated material
Author :
Aziz, Ahmedullah ; Shukla, Nikhil ; Datta, Suman ; Gupta, Sumeet Kumar
Author_Institution :
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
fYear :
2015
fDate :
21-24 June 2015
Firstpage :
43
Lastpage :
44
Abstract :
Summary form only given. We propose a technique based on connecting CM like VO2 in parallel with the MTJ in the read path of multi-port MRAMs. Utilizing insulator-metal transitions in CM, the proposed cell achieves 1.7X to 4.3X improvement in cell TMR (CTMR) along with 7% to 22% higher read disturb margin compared to a baseline cell. Due to the separation of read-write paths in multi-port MRAMs, the CM has no effect on the write operation. The proposed idea is not limited to VO2 and its benefits may be further enhanced by exploring other suitable CMs [6] or by tuning the properties like resistivities, critical currents and thermal stability by techniques like strain [7] or Cr doping [8].
Keywords :
MRAM devices; chromium; thermal stability; tunnelling magnetoresistance; CTMR; Cr; MTJ; baseline cell; cell tunnelling magnetoresistance; correlated material; insulator-metal transitions; magnetic tunnel junction; multiport MRAM; read disturb margin; read-write paths; thermal stability; write operation; Doping; Magnetic tunneling; Molecular beam applications; Molecular beam epitaxial growth; Standards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location :
Columbus, OH
Print_ISBN :
978-1-4673-8134-5
Type :
conf
DOI :
10.1109/DRC.2015.7175544
Filename :
7175544
Link To Document :
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