DocumentCode :
729290
Title :
Wacky oxides: Rich properties in search of devices
Author :
Schlom, Darrell G.
Author_Institution :
Dept. of Mater. Sci. & Eng., Cornell Univ., Ithaca, NY, USA
fYear :
2015
fDate :
21-24 June 2015
Firstpage :
225
Lastpage :
226
Abstract :
Until recently, the word “oxide” could only mean one thing to the device research community-SiO2. But as is being increasingly realized, oxides are an exciting class of electronic materials in their own right. Oxides exhibit the full spectrum of electronic, optical, and magnetic behavior: insulating, semiconducting, metallic, superconducting, ferroelectric, pyroelectric, piezoelectric, ferromagnetic, multiferroic, and non-linear optical effects are all possessed by structurally-compatible oxides. Further, the properties of a given composition can change drastically as it goes through phase transitions that can be driven by temperature, strain, electric field, magnetic field, light, etc., resulting in huge property coefficients, metal-insulator-transitions, electrical and optical control of magnetism, etc. The unparalleled variety of physical properties of oxides holds tremendous promise for electronic applications, but there is also a danger that oxides may become the immutable “material of the future” that never makes it into a real device.
Keywords :
metal-insulator transition; electric field; electronic materials; ferroelectric effect; ferromagnetic effect; insulating effect; magnetic field; magnetism electrical control; magnetism optical control; metal-insulator-transitions; metallic effect; multiferroic effect; nonlinear optical effect; phase transitions; physical properties; piezoelectric effect; pyroelectric effect; semiconducting effect; structurally-compatible oxides; superconducting effect; wacky oxides; Magnetic devices; Magnetic properties; Magnetic resonance imaging; Optical devices; Optical films; Optical imaging; Optical switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location :
Columbus, OH
Print_ISBN :
978-1-4673-8134-5
Type :
conf
DOI :
10.1109/DRC.2015.7175648
Filename :
7175648
Link To Document :
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