Title :
Novel method to determine the band offset in hetero staggered bandgap TFET using Esaki diodes
Author :
Smets, Q. ; Verhulst, A.S. ; El Kazzi, S. ; Mocuta, A. ; Thean, V.-Y. ; Heyns, M.M.
Author_Institution :
Imec, Heverlee, Belgium
Abstract :
Summary form only given. In heterojunction Tunneling Field-Effect Transistors (TFET), the effective tunneling bandgap (Eg,eff) has a strong impact on the on-current (Ion) and the subthreshold swing (SS) (figure 1). There is however significant uncertainty on Eg,eff for the staggered heterojunction In0.53Ga0.47As/GaAs0.50Sb0.50 (InGaAs/GaAsSb), with values in literature ranging from 0.5 eV to 0.27 eV [3-6]. An additional problem is that Eg,eff is usually measured optically on lowly doped heterojunctions [7-8]. These values may be far off for use in TFETs where there is bandgap narrowing due to heavy doping (doping-BGN) in the source and pocket regions. The impact of doping-BGN on Band-To-Band Tunneling (BTBT) is currently not well understood, contributing to the difficulty in making quantitative hetero-TFET predictions.
Keywords :
gallium compounds; high electron mobility transistors; indium compounds; semiconductor device models; semiconductor doping; tunnel diodes; tunnel transistors; BTBT; Esaki diodes; In0.53Ga0.47As-GaAs0.50Sb0.50; band offset; band-to-band tunneling; doped heterojunctions; doping-BGN; effective tunneling bandgap; hetero-TFET predictions; heterojunction tunneling field-effect transistors; heterostaggered bandgap TFET; subthreshold swing; Doping; Heterojunctions; Indium gallium arsenide; Optical variables measurement; Photonic band gap; Tunneling;
Conference_Titel :
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location :
Columbus, OH
Print_ISBN :
978-1-4673-8134-5
DOI :
10.1109/DRC.2015.7175664