DocumentCode :
72932
Title :
Evaluating Plasmonic Light Trapping With Photoluminescence
Author :
Barugkin, Chog ; Yimao Wan ; Macdonald, Daniel ; Catchpole, Kylie R.
Author_Institution :
Res. Sch. of Eng., Australian Nat. Univ., Canberra, ACT, Australia
Volume :
3
Issue :
4
fYear :
2013
fDate :
Oct. 2013
Firstpage :
1292
Lastpage :
1297
Abstract :
We use photoluminescence measurements to quantify the light trapping for a range of plasmonic structures. By combining Ag nanoparticles as a scattering structure and diffuse white paint as a back surface reflector (BSR) on silicon wafers, we can achieve absorption enhancement of 62% of the Lambertian value, which is comparable with literature values for inverted pyramids of 67%. Through measurements of the effective carrier lifetime, we also establish that plasmonic Ag particles do not degrade the electrical properties of the passivation layer.
Keywords :
elemental semiconductors; nanoparticles; photoluminescence; plasmonics; silicon; silver; Ag; Lambertian value; Si; absorption enhancement; back surface reflector; diffuse white paint; effective carrier lifetime; inverted pyramid; nanoparticles; photoluminescence; plasmonic light trapping; plasmonic structures; scattering structure; silicon wafer; Absorption; Charge carrier processes; Light trapping; Nanoparticles; Passivation; Photoluminescence; Photovoltaic cells; Plasmons; Silicon; Absorption; nanoparticles; photoluminescence; silicon;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2013.2273570
Filename :
6575129
Link To Document :
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