• DocumentCode
    72939
  • Title

    Yield-Aware Pareto Front Extraction for Discrete Hierarchical Optimization of Analog Circuits

  • Author

    Seobin Jung ; Jiho Lee ; Jaeha Kim

  • Author_Institution
    Electr. Eng. & Comput. Sci. Dept., UC Berkeley, Berkeley, CA, USA
  • Volume
    33
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    1437
  • Lastpage
    1449
  • Abstract
    This paper presents an efficient method for extracting a yield-aware Pareto front between two competing metrics of an analog circuit block, with the purpose of performing hierarchical, system-level optimization using the component-level Pareto fronts as meta-models. The proposed method consists of three steps: finding a set of Pareto-optimal design points by tracing them on a discrete grid, estimating the yield distribution of each optimal design point using a control-variate technique, and constructing a yield-aware Pareto front by interpolation. The proposed algorithm is demonstrated on a problem of finding the optimal power allocation among the components composing a clock recovery path to minimize the final clock jitter. The algorithm can estimate the Pareto front of each circuit block within a 2% error, expressing the minimum achievable jitter with 99% yield for different power budgets, while requiring only 600 ~ 1100 Monte-Carlo simulation samples in total.
  • Keywords
    Pareto optimisation; analogue circuits; circuit optimisation; interpolation; Monte-Carlo simulation; Pareto-optimal design points; analog circuit block; clock jitter minimization; clock recovery path; component-level Pareto fronts; control-variate technique; discrete grid; discrete hierarchical optimization; hierarchical system-level optimization; interpolation; meta-models; optimal power allocation; power budgets; yield distribution estimation; yield-aware Pareto front extraction method; Algorithm design and analysis; Clocks; Correlation; Jitter; Mixers; Optimization; Analog/mixed-signal circuits; circuit optimization; hierarchical optimization; pareto-front extraction; yield-aware optimization;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2014.2331563
  • Filename
    6899766