DocumentCode :
729758
Title :
Fast Two-Cycle level set tracking with narrow perception of background
Author :
Yaochen Li ; Yuanqi Su ; Yuehu Liu
Author_Institution :
Xi´an Jiaotong Univ., Xianning, China
fYear :
2015
fDate :
June 29 2015-July 3 2015
Firstpage :
1
Lastpage :
6
Abstract :
The problem of tracking foreground objects in a video sequence with moving background remains challenging. In this paper, we propose the Fast Two-Cycle level set method with Narrow band Background (FTCNB) to automatically extract the foreground objects in such video sequences. The level set curve evolution process consists of two successive cycles: one cycle for data dependent term and a second cycle for smoothness regularization. The curve evolution is implemented by computing the signs of region competition terms on two linked lists of contour pixels rather than solving any Partial Differential Equations (PDEs). Maximum A Posterior (MAP) optimization is applied in the FTCNB method for curve refinement with the assistance of optical flows. The comparison with other level set methods demonstrate the tracking accuracy of our method. The tracking speed of the proposed method also outperforms the traditional level set methods.
Keywords :
feature extraction; image sequences; maximum likelihood estimation; object tracking; optimisation; video signal processing; FTCNB method; MAP optimization; automatic foreground object extraction; contour pixels; curve refinement; data dependent term; fast-two-cycle level set tracking; foreground object tracking; level set curve evolution process; linked lists; maximum a-posterior optimization; moving background; narrow perception; narrow-band background; optical flow assistance; smoothness regularization; tracking speed; video sequences; Image color analysis; Image segmentation; Kernel; Level set; Mathematical model; Switches; Video sequences; curve evolution; level set; maximum likelihood; region competition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo (ICME), 2015 IEEE International Conference on
Conference_Location :
Turin
Type :
conf
DOI :
10.1109/ICME.2015.7177471
Filename :
7177471
Link To Document :
بازگشت