• DocumentCode
    729920
  • Title

    Parasitic effects of device coupling on haptic performance

  • Author

    Gallacher, Colin ; Willes, John ; Kovecses, Jozsef

  • Author_Institution
    Centre for Intell. Machines, McGill Univ., Montreal, QC, Canada
  • fYear
    2015
  • fDate
    22-26 June 2015
  • Firstpage
    266
  • Lastpage
    272
  • Abstract
    The device dynamics of haptic systems play a crucial role in the performance of the human user. Typical operation of a haptic device during simulation requires the user to perform common tasks that constitute the bases for all user actions. These common tasks include manipulation, selection, and navigation. Navigation requires the user to transition the end-effector across regions of the device workspace moving to a new location of interest within the virtual scene. In this study we investigate the role that the inertia tensor coupling has on user performance during navigational tasks. We also adapt the operation and admissible-motion space representation for haptic systems in which forces causing deviations from a desired path can be thought of as parasitic forces that degrade a users performance. Dynamic simulations were carried out to gain insight into the effects of navigating along paths of varying coupling using a 2DOF five-bar mechanism and were experimentally validated with a Quansar 2DOF Pantograph device.
  • Keywords
    end effectors; haptic interfaces; virtual reality; 2DOF five-bar mechanism; Quansar 2DOF pantograph device; admissible-motion space representation; device coupling; device dynamics; device workspace; dynamic simulation; end-effector; haptic device; haptic performance; haptic system; human user; inertia tensor coupling; navigational task; parasitic effect; parasitic force; user performance; varying coupling; virtual scene; Acceleration; Couplings; Dynamics; Haptic interfaces; Navigation; Performance evaluation; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    World Haptics Conference (WHC), 2015 IEEE
  • Conference_Location
    Evanston, IL
  • Type

    conf

  • DOI
    10.1109/WHC.2015.7177724
  • Filename
    7177724