DocumentCode :
730011
Title :
ACR BER correlation to ATE for a COFDM VHF RX
Author :
Sarson, Peter
Author_Institution :
Full Service Foundry Test Dev., ams AG, Unterpremstaetten, Austria
fYear :
2015
fDate :
24-26 June 2015
Firstpage :
1
Lastpage :
4
Abstract :
With a BER to SNR correlation, it was found that it was possible to test ACR in VHF receivers with one measurement. Moving component testing for any device from the bench to ATE poses many challenges, but releasing a high-speed RF device with a design margin issue to a production setting is somewhat challenging. To facilitate the testing of ACR in a production environment, a technique was found that correlated ACR in terms of BER to SNR. This technique, which was developed for ATE, also greatly reduced test time whilst ensuring highly reliable test results.
Keywords :
OFDM modulation; VHF devices; adjacent channel interference; automatic test equipment; error statistics; interference suppression; radio receivers; ACR BER correlation; ATE; COFDM VHF RX; RF device; SNR correlation; VHF receivers; design margin issue; moving component testing; Bit error rate; Correlation; Density measurement; Generators; Power measurement; Radio frequency; Signal to noise ratio; Adjacent Channel Rejection (ACR); Automated Test Equipment (ATE); Bit Error Rate (BER); Coded Othoganal Frequency Domain Multiplex (COFDM); Differential Quadrature Phase Shift Keying (DQPSK); Error Vector Magnetude (EVM); Peak to Average Ratio (PAR); Radio Frequency (RF); Recievers (RX); Signal to Noise Ratio (SNR); Very High Frequency (VHF);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed-Signal Testing Workshop (IMSTW), 2015 20th International
Conference_Location :
Paris
Type :
conf
DOI :
10.1109/IMS3TW.2015.7177861
Filename :
7177861
Link To Document :
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