ACR BER correlation to ATE for a COFDM VHF RX

Author

Sarson, Peter

Author_Institution

Full Service Foundry Test Dev., ams AG, Unterpremstaetten, Austria

fYear

2015

fDate

24-26 June 2015

Firstpage

1

Lastpage

4

Abstract

With a BER to SNR correlation, it was found that it was possible to test ACR in VHF receivers with one measurement. Moving component testing for any device from the bench to ATE poses many challenges, but releasing a high-speed RF device with a design margin issue to a production setting is somewhat challenging. To facilitate the testing of ACR in a production environment, a technique was found that correlated ACR in terms of BER to SNR. This technique, which was developed for ATE, also greatly reduced test time whilst ensuring highly reliable test results.

Keywords

OFDM modulation; VHF devices; adjacent channel interference; automatic test equipment; error statistics; interference suppression; radio receivers; ACR BER correlation; ATE; COFDM VHF RX; RF device; SNR correlation; VHF receivers; design margin issue; moving component testing; Bit error rate; Correlation; Density measurement; Generators; Power measurement; Radio frequency; Signal to noise ratio; Adjacent Channel Rejection (ACR); Automated Test Equipment (ATE); Bit Error Rate (BER); Coded Othoganal Frequency Domain Multiplex (COFDM); Differential Quadrature Phase Shift Keying (DQPSK); Error Vector Magnetude (EVM); Peak to Average Ratio (PAR); Radio Frequency (RF); Recievers (RX); Signal to Noise Ratio (SNR); Very High Frequency (VHF);

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signal Testing Workshop (IMSTW), 2015 20th International

Conference_Location

Paris

Type

conf

DOI

10.1109/IMS3TW.2015.7177861

Filename

7177861