DocumentCode :
73018
Title :
High-Performance GaN-Based Nanochannel FinFETs With/Without AlGaN/GaN Heterostructure
Author :
Ki-Sik Im ; Chul-Ho Won ; Young-Woo Jo ; Jae-Hoon Lee ; Bawedin, M. ; Cristoloveanu, S. ; Jung-Hee Lee
Author_Institution :
Sch. of Electron. Eng., Kyungpook Nat. Univ., Daegu, South Korea
Volume :
60
Issue :
10
fYear :
2013
fDate :
Oct. 2013
Firstpage :
3012
Lastpage :
3018
Abstract :
Two types of fin-shaped field-effect transistors (FinFETs), one with AlGaN/GaN heterojunction and the other with heavily doped heterojunction-free GaN layer operating in junctionless mode, have been fabricated and characterized. The threshold voltages of both devices shift toward positive direction from large negative value as the fin width decreases. Both devices exhibit high ON-state performance. The heterojunction-free GaN FinFETs show superior OFF-state performance because the current flows through the volume of the GaN channel layer, which can be fully depleted. The proposed GaN nanochannel FinFETs are very promising candidates not only for high performance, but also for high power applications.
Keywords :
III-V semiconductors; MOSFET; aluminium compounds; gallium compounds; wide band gap semiconductors; AlGaN-GaN; OFF-state performance; ON-state performance; fin-shaped field-effect transistors; heavily doped heterojunction-free layer; high power applications; junctionless mode; nanochannel FinFET; negative value; positive direction; threshold voltages; Aluminum gallium nitride; Aluminum oxide; FinFETs; Gallium nitride; Logic gates; Performance evaluation; Threshold voltage; 2-D electron gas (2-DEG); AlGaN/GaN; MOSFET; fin-shaped field-effect transistor (FinFET); heterojunction; high-electron mobility transistor (HEMT); junctionless; nanochannel; triple gate;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2274660
Filename :
6575137
Link To Document :
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