DocumentCode
73018
Title
High-Performance GaN-Based Nanochannel FinFETs With/Without AlGaN/GaN Heterostructure
Author
Ki-Sik Im ; Chul-Ho Won ; Young-Woo Jo ; Jae-Hoon Lee ; Bawedin, M. ; Cristoloveanu, S. ; Jung-Hee Lee
Author_Institution
Sch. of Electron. Eng., Kyungpook Nat. Univ., Daegu, South Korea
Volume
60
Issue
10
fYear
2013
fDate
Oct. 2013
Firstpage
3012
Lastpage
3018
Abstract
Two types of fin-shaped field-effect transistors (FinFETs), one with AlGaN/GaN heterojunction and the other with heavily doped heterojunction-free GaN layer operating in junctionless mode, have been fabricated and characterized. The threshold voltages of both devices shift toward positive direction from large negative value as the fin width decreases. Both devices exhibit high ON-state performance. The heterojunction-free GaN FinFETs show superior OFF-state performance because the current flows through the volume of the GaN channel layer, which can be fully depleted. The proposed GaN nanochannel FinFETs are very promising candidates not only for high performance, but also for high power applications.
Keywords
III-V semiconductors; MOSFET; aluminium compounds; gallium compounds; wide band gap semiconductors; AlGaN-GaN; OFF-state performance; ON-state performance; fin-shaped field-effect transistors; heavily doped heterojunction-free layer; high power applications; junctionless mode; nanochannel FinFET; negative value; positive direction; threshold voltages; Aluminum gallium nitride; Aluminum oxide; FinFETs; Gallium nitride; Logic gates; Performance evaluation; Threshold voltage; 2-D electron gas (2-DEG); AlGaN/GaN; MOSFET; fin-shaped field-effect transistor (FinFET); heterojunction; high-electron mobility transistor (HEMT); junctionless; nanochannel; triple gate;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2274660
Filename
6575137
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