Title :
Reducing attendance time in LR-EPONs with differentiated services
Author :
Elrasad, Amr ; Shihada, Basem
Author_Institution :
CEMSE, King Abdullah Univ. of Sci. & Technol. (KAUST), Thuwal, Saudi Arabia
fDate :
April 26 2015-May 1 2015
Abstract :
This work presents a novel on-the-fly void filling scheme for Long-Reach EPON called Size Controlled Batch Void Filling (SCBVF). SCBVF aims at reducing the time between consecutive bandwidth grants (attendance time) and hence reducing the average delay for delay-sensitive traffic.
Keywords :
local area networks; passive optical networks; telecommunication traffic; Ethernet passive optical networks; LR-EPON; attendance time; delay-sensitive traffic; long-reach EPON; on-the-fly void filling scheme; size controlled batch void filling; Bandwidth; Conferences; Delays; EPON; Filling; IEEE 802.3 Standard; Optical network units;
Conference_Titel :
Computer Communications Workshops (INFOCOM WKSHPS), 2015 IEEE Conference on
Conference_Location :
Hong Kong
DOI :
10.1109/INFCOMW.2015.7179345
