Title :
Measuring cascade effects in interdependent networks by using effective graph resistance
Author :
Tauch, Sotharith ; Liu, William ; Pears, Russel
Author_Institution :
Sch. of Comput. & Math. Sci., Auckland Univ. of Technol. Auckland, Auckland, New Zealand
fDate :
April 26 2015-May 1 2015
Abstract :
Understanding the correlation between the underlie network structure and overlay cascade effects in the interdependent networks is one of major challenges in complex network studies. There are some existing metrics that can be used to measure the cascades. However, different metrics such as average node degree interpret different characteristic of network topological structure, especially less metrics have been identified to effectively measure the cascading performance in the interdependent networks. In this paper, we propose to use a combined Laplacian matrix to model the interdependent networks and their interconnectivity, and then use its effective resistance metric as an indicator to its cascading behavior. Moreover, we have conducted extensive comparative studies among different metrics such as average node degree, and the proposed effective resistance. We have found that the effective resistance metric can describe more accurate and finer characteristics of topological structure of the interdependent networks than average node degree which is widely adapted by the existing research studies for measuring the cascading performance in the interdependent networks.
Keywords :
complex networks; graph theory; matrix algebra; network theory (graphs); Laplacian matrix; average node degree; complex network; effective graph resistance; interdependent networks; network topological structure; overlay cascade effects; underlie network structure; Electrical resistance measurement; Laplace equations; Load modeling; Mathematical model; Niobium; Resistance; Average node degree; Cascade effects; Effective graph resistance; Interconnected networks; Network robustness; Topopogical metrics;
Conference_Titel :
Computer Communications Workshops (INFOCOM WKSHPS), 2015 IEEE Conference on
Conference_Location :
Hong Kong
DOI :
10.1109/INFCOMW.2015.7179465