DocumentCode :
731082
Title :
Multipactor breakdown modelling using an averaged version of Furman´s SEY model
Author :
Rice, S. ; Verboncoeur, J.
Author_Institution :
Michigan State Univ., East Lansing, MI, USA
fYear :
2015
fDate :
24-28 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. The formation of multipactor is strongly dependent upon the secondary electron yield (SEY) of a surface, and the emission velocities of the emitted electrons. Furman and Pivi proposed a SEY model1 that is frequently used and is considered to be quite accurate, but this model is based around a stochastic scattering process, which necessitates computationally costly Monte-Carlo simulations in order to simulate the formation of multipactor in a given system. In our previous work2,3. we presented an approximation to Furman´s model, in which for a given particle impact velocity, a single weighted particle is emitted, thus avoiding Monte Carlo simulations to model multipactor current; this particle was chosen to be simply the median of the underlying scattering distribution. In this present work, we generalize the previous approximation to Furman´s fully stochastic model by examining other emission energy statistics to represent the underlying stochastic scattering behavior. We then provide error metrics for evaluating these approximations, and suggest how a suitable simplification to Furman´s model may be chosen to best model the initiation of multipactor. The results were obtained through simulations in a coaxial geometry, but are expected to be generalizable to other geometries.
Keywords :
Monte Carlo methods; microwave switches; secondary electron emission; stochastic processes; Furman SEY model; Monte-Carlo simulation; electron emission; emission energy statistics; emission velocity; multipactor breakdown modelling; multipactor current; particle impact velocity; scattering distribution; secondary electron yield; stochastic scattering process;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Sciences (ICOPS), 2015 IEEE International Conference on
Conference_Location :
Antalya
Type :
conf
DOI :
10.1109/PLASMA.2015.7179542
Filename :
7179542
Link To Document :
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