• DocumentCode
    731082
  • Title

    Multipactor breakdown modelling using an averaged version of Furman´s SEY model

  • Author

    Rice, S. ; Verboncoeur, J.

  • Author_Institution
    Michigan State Univ., East Lansing, MI, USA
  • fYear
    2015
  • fDate
    24-28 May 2015
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The formation of multipactor is strongly dependent upon the secondary electron yield (SEY) of a surface, and the emission velocities of the emitted electrons. Furman and Pivi proposed a SEY model1 that is frequently used and is considered to be quite accurate, but this model is based around a stochastic scattering process, which necessitates computationally costly Monte-Carlo simulations in order to simulate the formation of multipactor in a given system. In our previous work2,3. we presented an approximation to Furman´s model, in which for a given particle impact velocity, a single weighted particle is emitted, thus avoiding Monte Carlo simulations to model multipactor current; this particle was chosen to be simply the median of the underlying scattering distribution. In this present work, we generalize the previous approximation to Furman´s fully stochastic model by examining other emission energy statistics to represent the underlying stochastic scattering behavior. We then provide error metrics for evaluating these approximations, and suggest how a suitable simplification to Furman´s model may be chosen to best model the initiation of multipactor. The results were obtained through simulations in a coaxial geometry, but are expected to be generalizable to other geometries.
  • Keywords
    Monte Carlo methods; microwave switches; secondary electron emission; stochastic processes; Furman SEY model; Monte-Carlo simulation; electron emission; emission energy statistics; emission velocity; multipactor breakdown modelling; multipactor current; particle impact velocity; scattering distribution; secondary electron yield; stochastic scattering process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Sciences (ICOPS), 2015 IEEE International Conference on
  • Conference_Location
    Antalya
  • Type

    conf

  • DOI
    10.1109/PLASMA.2015.7179542
  • Filename
    7179542