• DocumentCode
    731096
  • Title

    Recent development for a plasma diagnostic with optically trapped microparticles

  • Author

    Schneider, Viktor ; Kersten, Holger

  • Author_Institution
    Inst. of Exp. & Appl. Phys., Christian-Albrechts-Univ. Kiel, Kiel, Germany
  • fYear
    2015
  • fDate
    24-28 May 2015
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The idea to use microparticles for plasma diagnostic purposes was implemented during the last years by several experiments as electrostatic or thermal probes1-5. In contrast to the commonly used diagnostic methods, microparticles rarely influence the surrounding plasma. However, the particle position and, thus, the measurement is mostly restricted to the plasma sheath region by the force balance. A change in the position, often possible only into one direction, is then associated with a considerable effort or just by changing the discharge and, thus, by changing the plasma parameters itself. Based on the principle of laser tweezing6, we present a noninvasive method for trapping and arbitrary manipulation of the microparticles position in the plasma7. We demonstrate how an externally applied force on the particle is determined by a position determination in the trap. Furthermore, we present the current stage of development as well as some possible plasma diagnostic applications.
  • Keywords
    particle traps; plasma diagnostics; plasma sheaths; electrostatic probes; force balance; laser tweezing principle; optically trapped microparticles; plasma diagnostic applications; plasma sheath region; thermal probes; Atmospheric measurements; Charge carrier processes; Electrostatics; Force; Plasma diagnostics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Sciences (ICOPS), 2015 IEEE International Conference on
  • Conference_Location
    Antalya
  • Type

    conf

  • DOI
    10.1109/PLASMA.2015.7179558
  • Filename
    7179558