DocumentCode
731096
Title
Recent development for a plasma diagnostic with optically trapped microparticles
Author
Schneider, Viktor ; Kersten, Holger
Author_Institution
Inst. of Exp. & Appl. Phys., Christian-Albrechts-Univ. Kiel, Kiel, Germany
fYear
2015
fDate
24-28 May 2015
Firstpage
1
Lastpage
1
Abstract
Summary form only given. The idea to use microparticles for plasma diagnostic purposes was implemented during the last years by several experiments as electrostatic or thermal probes1-5. In contrast to the commonly used diagnostic methods, microparticles rarely influence the surrounding plasma. However, the particle position and, thus, the measurement is mostly restricted to the plasma sheath region by the force balance. A change in the position, often possible only into one direction, is then associated with a considerable effort or just by changing the discharge and, thus, by changing the plasma parameters itself. Based on the principle of laser tweezing6, we present a noninvasive method for trapping and arbitrary manipulation of the microparticles position in the plasma7. We demonstrate how an externally applied force on the particle is determined by a position determination in the trap. Furthermore, we present the current stage of development as well as some possible plasma diagnostic applications.
Keywords
particle traps; plasma diagnostics; plasma sheaths; electrostatic probes; force balance; laser tweezing principle; optically trapped microparticles; plasma diagnostic applications; plasma sheath region; thermal probes; Atmospheric measurements; Charge carrier processes; Electrostatics; Force; Plasma diagnostics;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Sciences (ICOPS), 2015 IEEE International Conference on
Conference_Location
Antalya
Type
conf
DOI
10.1109/PLASMA.2015.7179558
Filename
7179558
Link To Document