Title :
RF ion source modeling using fluid-based plasma models
Author :
Beckwith, Kris ; Veitzer, Seth ; Stoltz, Peter H.
Author_Institution :
Tech-X Corp., Boulder, CO, USA
Abstract :
Summary form only given. Ion source performance for accelerators and industrial applications can be improved through detailed numerical modeling and simulation. There are a number of technical complexities with developing robust models, including a natural separation of important time scales (rf, electron and ion motion), inclusion of plasma chemistry, and surface effects such as secondary electron emission and sputtering. Due to these computational requirements, it is typically difficult to simulate ion sources with Particle-In-Cell codes.An alternative is to use fluid-based codes coupled with electromagnetics in order to model ion sources. These types of models can simulate plasma evolution and rf-driven flows while maintaining good performance. We show here recent results on modeling the Hion source for the Spallation Neutron Source (SNS) at Oak Ridge National Laboratory (ORNL) using the fluid plasma modeling code USim. We will present results from a range of fluid models with varying degrees of complexity and examine the tradeoff between between physical fidelity and time-to-solution.
Keywords :
electromagnetism; high-frequency discharges; hydrogen; ion sources; nuclear spallation; plasma accelerators; plasma chemistry; plasma magnetohydrodynamics; plasma materials processing; plasma simulation; plasma sources; secondary electron emission; sputtering; H- ion source; ORNL; Oak Ridge National Laboratory; Particle-In-Cell codes; RF ion source modeling; SNS; Spallation Neutron Source; USim; accelerators; electromagnetics; fluid plasma modeling code; fluid-based codes; fluid-based plasma models; industrial applications; ion source performance; natural separation; numerical modeling; numerical simulation; physical fidelity; plasma chemistry; plasma evolution; rf-driven flows; secondary electron emission; sputtering; time scales; time-to-solution; Complexity theory; Computational modeling; Fluids; Ion sources; Numerical models; Plasmas; Radio frequency;
Conference_Titel :
Plasma Sciences (ICOPS), 2015 IEEE International Conference on
Conference_Location :
Antalya
DOI :
10.1109/PLASMA.2015.7179829