DocumentCode :
731339
Title :
Time integrated study of x-ray emission by APF plasma focus device
Author :
Habibi, Morteza
Author_Institution :
Energy Eng. & Phys. Dept., Amirkabir Univ. of Technol., Tehran, Iran
fYear :
2015
fDate :
24-28 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. Time-resolved studies of soft and hard x-ray were carried out over a wide range of argon pressures by employing an array of 8 filtered photo PIN diodes and a scintillation detector, simultaneously. In 50% of the discharges, the soft x-ray is seen to be emitted in short multiple pulses corresponding to different compression, whereas it is a single pulse for hard x-rays corresponding to only the first strong compression. It should be stated that multiple compressions dominantly occur at low pressures and high pressures are mostly in the single compression regime. In 43% of the discharges, at all pressures except for the optimum pressure, the first period is characterized by two or more sharp peaks. The x-ray signal intensity during the second and subsequent compressions is much smaller than the first compression.
Keywords :
argon; p-i-n photodiodes; plasma X-ray sources; plasma diagnostics; plasma focus; scintillation counters; APF plasma focus device; Ar; X-ray emission; X-ray signal intensity; argon pressures; filtered photo PIN diode array; hard X-ray; multiple compressions; optimum pressure; scintillation detector; short multiple pulses; single compression regime; soft X-ray; time integrated study; Argon; Arrays; Detectors; Discharges (electric); PIN photodiodes; Physics; Plasmas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Sciences (ICOPS), 2015 IEEE International Conference on
Conference_Location :
Antalya
Type :
conf
DOI :
10.1109/PLASMA.2015.7179857
Filename :
7179857
Link To Document :
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