DocumentCode
731349
Title
Spectroscopic determination of magnetic fields in high energy electron beam diodes
Author
Johnston, M.D. ; Patel, S.G. ; Muron, D.J. ; Kiefer, M.L. ; Maron, Yitzhak
Author_Institution
Sandia Nat. Labs. Albuquerque, Albuquerque, NM, USA
fYear
2015
fDate
24-28 May 2015
Firstpage
1
Lastpage
1
Abstract
The RITS-6 accelerator (5-11MeV, 100-200kA) at SNL is being used to evaluate the Self-Magnetic Pinch (SMP) diode as a flash x-ray radiography source1. This diode utilizes a small, hollowed, metal cathode and a planar high atomic number anode to produce a focused electron beam (<; 3mm) which generates high energy Bremsstrahlung x-rays. During this process, electrode plasmas form and propagate in an approximately 1cm A-K vacuum gap. These plasmas are measured spectroscopically using high resolution (<;1 Angstrom) Czerny-Turner spectrometers with ICCD and/or streak camera outputs. This paper explores using a novel plasma spectroscopy method to measure the magnetic fields (1-25 Tesla) within the SMP diode. With this technique, the magnetic field effects on line shapes and fine structure features can be measured even when the line shapes are dominated by Stark or Doppler broadening. This provides a great advantage, over other techniques such as Faraday rotation or polarization spectroscopy. Several suitable line species have been identified and experimentally measured. Recent results with inferred B-fields will be presented.
Keywords
X-ray apparatus; electrodes; electron beam focusing; plasma diodes; radiography; A-K vacuum gap; Czerny-Turner spectrometers; Doppler broadening; Faraday rotation; RITS-6 accelerator; SNL; Stark broadening; electrode plasmas; flash x-ray radiography source; high energy Bremsstrahlung x-rays; high energy electron beam diodes; magnetic fields spectroscopic determination; planar high atomic number anode; plasma spectroscopy method; polarization spectroscopy; self-magnetic pinch diode; streak camera outputs; Electron beams; Laboratories; Magnetic field measurement; Magnetic fields; Plasma measurements; Plasmas; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Sciences (ICOPS), 2015 IEEE International Conference on
Conference_Location
Antalya
Type
conf
DOI
10.1109/PLASMA.2015.7179868
Filename
7179868
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