DocumentCode :
731715
Title :
Optical fiber atomic force microscope with photonic crystal force sensor
Author :
Gellineau, A. ; Wong, Y.-P. ; Wang, A. ; Butte, M.J. ; Solgaard, O.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear :
2015
fDate :
21-25 June 2015
Firstpage :
196
Lastpage :
199
Abstract :
An atomic force microscope (AFM) integrated directly on the facet of a standard single-mode optical fiber is designed, fabricated, and tested. High resolution force sensing is achieved with a Fabry-Perot interferometer made of two photonic crystal (PC) mirrors separated by silicon springs. The device is fabricated with standard MEMS techniques and assembled on the facet of a single mode optical fiber by focus ion beam (FIB) welding and OmniProbe manipulation. We demonstrate that topographic and tip-sample interaction force information can be extracted from its reflected light. The force curve measurement has a resolution of 10pN/Hz0.5 in a drastically smaller footprint than traditional AFMs, which can enable in-vivo AFM imaging.
Keywords :
Fabry-Perot interferometers; atomic force microscopy; fibre optic sensors; focused ion beam technology; force sensors; microsensors; photonic crystals; welding; Fabry-Perot interferometer; MEMS techniques; OmniProbe manipulation; focus ion beam welding; force curve measurement; in-vivo AFM imaging; optical fiber atomic force microscope; photonic crystal force sensor; photonic crystal mirrors; reflected light; silicon springs; standard single-mode optical fiber; tip-sample interaction force; topography; Force; Mirrors; Optical fiber sensors; Optical fibers; Probes; Silicon; Atomic Force Microscopy; Fabry-Perot Sensor; Photonic Crystal;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on
Conference_Location :
Anchorage, AK
Type :
conf
DOI :
10.1109/TRANSDUCERS.2015.7180895
Filename :
7180895
Link To Document :
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