Title :
Fabrication and characterisation of ScAlN -based piezoelectric MEMS cantilevers
Author :
Mayrhofer, P.M. ; Wistrela, E. ; Kucera, M. ; Bittner, A. ; Schmid, U.
Author_Institution :
Inst. of Sensor & Actuator Syst., Vienna Univ. of Technol., Vienna, Austria
Abstract :
Scandium (Sc) doping of aluminium nitride (AlN) increases the piezoelectric actuation potential due to substantially enhanced piezoelectric constants. This work demonstrates the fabrication of MEMS cantilevers actuated by sputter deposited ScxAl1-xN thin films (x = 27 %) sandwiched between gold electrodes. Patterning of ScxAl1-xN films is performed by a reactive ion etching process using SiCl4. The dynamic actuation potential of the fabricated devices is evaluated with Laser Doppler Vibrometry and with electrical impedance spectroscopy measurements. When applying the Butterworth Van-Dyke equivalent circuit a significant increase of the effective transverse piezoelectric constant d31 is demonstrated.
Keywords :
aluminium compounds; cantilevers; electric impedance; equivalent circuits; micromechanical devices; piezoelectric actuators; scandium compounds; semiconductor doping; silicon compounds; sputter deposition; sputter etching; Butterworth Van-Dyke equivalent circuit; ScAlN; SiCl4; electrical impedance spectroscopy measurements; laser Doppler vibrometry; piezoelectric MEMS cantilevers; piezoelectric actuation; reactive ion etching process; sputter deposited; transverse piezoelectric constant; Aluminum nitride; Electrodes; Etching; Frequency measurement; Gold; III-V semiconductor materials; Micromechanical devices; Laser Doppler Vibrometer; MEMS cantilever; ScAlN thin films; impedance spectrum; piezoelectric;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on
Conference_Location :
Anchorage, AK
DOI :
10.1109/TRANSDUCERS.2015.7181383