• DocumentCode
    732060
  • Title

    AN ultra-low cost deep reactive ion etching (drie) tool for flexible, small volume manufacturing

  • Author

    Gould, P.A. ; Hsing, M.D. ; Li, H.Q. ; Gleason, K.K. ; Schmidt, M.A.

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2015
  • fDate
    21-25 June 2015
  • Firstpage
    2268
  • Lastpage
    2271
  • Abstract
    Our goal is to demonstrate that we can achieve a radical reduction in the capital cost of micro/nano-manufacturing without sacrificing performance by scaling production throughput. As a demonstration of this concept, we show for the first time a DRIE system that processes small substrates (~1 in2) with performance comparable to commercial systems for a capital cost below $32K. We have designed, built and tested this system, which currently can achieve silicon etch rates up to 2.8 μm/min with vertical sidewall profiles, an estimated photoresist selectivity greater than 50:1, and etch depth non-uniformity to less than 2% across the substrate.
  • Keywords
    flexible manufacturing systems; production management; sputter etching; DRIE tool; flexible manufacturing; micro/nano-manufacturing; radical reduction; scaling production; small volume manufacturing; ultra-low cost deep reactive ion etching; Assembly; Atmospheric measurements; Cooling; Fabrication; Force measurement; Particle measurements; Substrates; Accessibility; Bosch Process; DRIE; Dry Etching; Fabrication; Low Cost; MEMS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on
  • Conference_Location
    Anchorage, AK
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2015.7181414
  • Filename
    7181414