DocumentCode :
732060
Title :
AN ultra-low cost deep reactive ion etching (drie) tool for flexible, small volume manufacturing
Author :
Gould, P.A. ; Hsing, M.D. ; Li, H.Q. ; Gleason, K.K. ; Schmidt, M.A.
Author_Institution :
Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear :
2015
fDate :
21-25 June 2015
Firstpage :
2268
Lastpage :
2271
Abstract :
Our goal is to demonstrate that we can achieve a radical reduction in the capital cost of micro/nano-manufacturing without sacrificing performance by scaling production throughput. As a demonstration of this concept, we show for the first time a DRIE system that processes small substrates (~1 in2) with performance comparable to commercial systems for a capital cost below $32K. We have designed, built and tested this system, which currently can achieve silicon etch rates up to 2.8 μm/min with vertical sidewall profiles, an estimated photoresist selectivity greater than 50:1, and etch depth non-uniformity to less than 2% across the substrate.
Keywords :
flexible manufacturing systems; production management; sputter etching; DRIE tool; flexible manufacturing; micro/nano-manufacturing; radical reduction; scaling production; small volume manufacturing; ultra-low cost deep reactive ion etching; Assembly; Atmospheric measurements; Cooling; Fabrication; Force measurement; Particle measurements; Substrates; Accessibility; Bosch Process; DRIE; Dry Etching; Fabrication; Low Cost; MEMS;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on
Conference_Location :
Anchorage, AK
Type :
conf
DOI :
10.1109/TRANSDUCERS.2015.7181414
Filename :
7181414
Link To Document :
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