DocumentCode :
732101
Title :
The Importance of Being Positive in Causal Statistical Fault Localization: Important Properties of Baah et al.´s CSFL Regression Model
Author :
Zhuofu Bai ; Shih-Feng Sun ; Podgurski, Andy
Author_Institution :
EECS Dept., Case Western Reserve Univ., Cleveland, OH, USA
fYear :
2015
fDate :
23-23 May 2015
Firstpage :
7
Lastpage :
13
Abstract :
This paper investigates the performance of Baah et al.´s causal regression model for fault localization when an important precondition for causal inference, called positivity, is violated. Two kinds of positivity violations are considered: structural and random ones. We prove that random, but not structural nonpositivity may harm the performance of Baah et al.´s causal estimator. To address the problem of random nonpositivity, we propose a modification to the way suspiciousness scores are assigned. Empirical results are presented that indicate it improves the performance of Baah et al.´s technique. We also present a probabilistic characterization of Baah et al.´s estimator, which provides a more efficient way to compute it.
Keywords :
inference mechanisms; regression analysis; software fault tolerance; CSFL regression model; causal inference; causal statistical fault localization; positivity; Flow graphs; Java; Mathematical model; Measurement; Probabilistic logic; Probability; XML; causal inference; conditional probability; positivity violation; statistical debugging; statistical fault localization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Complex Faults and Failures in Large Software Systems (COUFLESS), 2015 IEEE/ACM 1st International Workshop on
Conference_Location :
Florence
Type :
conf
DOI :
10.1109/COUFLESS.2015.9
Filename :
7181476
Link To Document :
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