• DocumentCode
    732238
  • Title

    High resolution, low offset Vertical Hall device in low-voltage CMOS technology

  • Author

    Osberger, Laurent ; Frick, Vincent ; Madec, Morgan ; Hebrard, Luc

  • Author_Institution
    ICube Lab., Univ. of Strasbourg, Strasbourg, France
  • fYear
    2015
  • fDate
    7-10 June 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Vertical Hall-effect devices (VHDs) are CMOS integrated sensors dedicated to the measurement of magnetic field in the plane of the chip. At low frequency performances are severely reduced by the 1/f noise. We recently proposed a theoretical study which confirm the capability of the spinning current technique to lower the 1/f noise on Low-Voltage VHD. In this paper, we proposed a practical way for the implementation of this technique. Experimental results bring out significant improvements. An offset of 0.1 mT and a resolution of 37 μT has been measured over a 1.6 kHz bandwidth.
  • Keywords
    1/f noise; CMOS integrated circuits; low-power electronics; magnetic fields; magnetic sensors; 1/f noise; CMOS integrated sensors; Vertical Hall-effect devices; bandwidth 1.6 kHz; low-voltage CMOS technology; magnetic field; spinning current technique; CMOS integrated circuits; CMOS technology; Magnetic sensors; Noise; Sensitivity; Spinning; CMOS technology; Vertical Hall Device; low noise; low offset; magnetic sensor; spinning current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    New Circuits and Systems Conference (NEWCAS), 2015 IEEE 13th International
  • Conference_Location
    Grenoble
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2015.7182008
  • Filename
    7182008