Title :
External cavity semiconductor laser optimized for frequency metrology
Author :
Wei Liang ; Ilchenko, Vladimir S. ; Eliyahu, Danny ; Dale, Elijah ; Savchenkov, Anatoliy A. ; Seidel, David ; Matsko, Andrey B. ; Maleki, Lute
Author_Institution :
OEwaves Inc., Pasadena, CA, USA
Abstract :
We report on the development of a frequency modulatable 795 nm semiconductor laser based on self-injection locking to a whispering gallery mode microresonator. The laser is characterized with residual amplitude modulation below -80 dB and frequency noise better than 300 Hz/Hz1/2 at offset frequencies ranging from 100 Hz to 10 MHz.
Keywords :
amplitude modulation; frequency modulation; laser cavity resonators; laser mode locking; laser noise; measurement by laser beam; optical modulation; semiconductor lasers; whispering gallery modes; external cavity semiconductor laser; frequency 100 Hz to 10 MHz; frequency metrology; frequency modulatable semiconductor laser; frequency noise; offset frequency; residual amplitude modulation; self-injection locking; wavelength 795 nm; whispering gallery mode microresonator; Amplitude modulation; Frequency modulation; Optical feedback; Optical resonators; Phase noise; Resonant frequency; Spectroscopy;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
