DocumentCode
732600
Title
Particle vs. mode entanglement in optical quantum metrology
Author
Quesada, Nicolas ; Sahota, Jaspreet
Author_Institution
McLennan Phys. Labs., Univ. of Toronto, Toronto, ON, Canada
fYear
2015
fDate
10-15 May 2015
Firstpage
1
Lastpage
3
Abstract
We present a constructive proof of the fact that mode entanglement is not necessary for optical quantum enhanced metrology (QEM) but particle entanglement is. We provide a particle entanglement witness that detects all path symmetric states useful for QEM in a Mach-Zender interferometer.
Keywords
Mach-Zehnder interferometers; light interference; photodetectors; quantum entanglement; quantum optics; Mach-Zender interferometer; QEM; all-path symmetric state detection; mode entanglement; optical quantum enhanced metrology; particle entanglement; Metrology; Optical interferometry; Optical sensors; Photonics; Probes; Protocols; Quantum entanglement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
7183035
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