DocumentCode :
733144
Title :
Near field measurements of the scattering phase function with evanescent field excitation
Author :
Naraghi, Roxana Rezvani ; Sukhov, Sergey ; Dogariu, Aristide
Author_Institution :
Coll. of Opt. &Photonics, CREOL, Orlando, FL, USA
fYear :
2015
fDate :
10-15 May 2015
Firstpage :
1
Lastpage :
2
Abstract :
Scattering phase functions of spherical particles excited with evanescent waves are measured using near-field optical scanning microscopy. Polarization dependent cross-sections and asymmetry parameters are determined to improve the predictive capabilities of light transport models.
Keywords :
light polarisation; light scattering; optical microscopy; asymmetry parameters; evanescent field excitation; light transport models; near field measurements; near-field optical scanning microscopy; polarization dependent cross-sections; scattering phase function; spherical particles; Microscopy; Mie scattering; Optical scattering; Optical surface waves; Optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
7183581
Link To Document :
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