DocumentCode :
733156
Title :
Fourier plane imaging microscopy
Author :
de Peralta, Luis Grave ; Bernussi, Ayrton A.
Author_Institution :
Dept. of Phys., Texas Tech Univ., Lubbock, TX, USA
fYear :
2015
fDate :
10-15 May 2015
Firstpage :
1
Lastpage :
2
Abstract :
Super-resolution images were obtained using a simple microscope formed by an ultrathin condenser and an objective lens. This was because the Fourier plane images carried more information about the object than real plane images do.
Keywords :
Fourier transform optics; lenses; optical images; optical microscopy; Fourier plane imaging microscopy; objective lens; super-resolution images; ultrathin condenser; Image resolution; Lenses; Microscopy; Optical diffraction; Optical microscopy; Optical surface waves; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
7183593
Link To Document :
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