DocumentCode
733241
Title
Improvement in in-plane localization precision of nanoparticles using interference analysis
Author
Meiri, Amihai ; Ebeling, Carl G. ; Martineau, Jason ; Zalevsky, Zeev ; Gerton, Jordan M. ; Menon, Rajesh
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Utah, Salt Lake City, UT, USA
fYear
2015
fDate
10-15 May 2015
Firstpage
1
Lastpage
2
Abstract
We present a method to improve the localization precision of nanoparticles over Gaussian fitting by imposing an interference pattern on the Point-Spread-Function. Localization precision of 0.1nm for a single emitter was obtained.
Keywords
Gaussian processes; light interference; nanoparticles; nanophotonics; optical transfer function; Gaussian fitting; in-plane localization precision; interference pattern analysis; nanoparticles; point-spread-function; Cities and towns; Fitting; Gratings; Image resolution; Interference; Microscopy; Nanoparticles;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
7183678
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