• DocumentCode
    733370
  • Title

    Effective carrier sweepout in a silicon waveguide by a metal-semiconductor-metal structure

  • Author

    Yunhong Ding ; Hao Hu ; Haiyan Ou ; Oxenlowe, Leif Katsuo ; Yvind, Kresten

  • Author_Institution
    Dept. of Photonics Eng., Tech. Univ. of Denmark, Lyngby, Denmark
  • fYear
    2015
  • fDate
    10-15 May 2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrate effective carrier depletion by metal-semiconductor-metal junctions for a silicon waveguide. Photo-generated carriers are efficiently swept out by applying bias voltages, and a shortest carrier lifetime of only 55 ps is demonstrated.
  • Keywords
    carrier lifetime; elemental semiconductors; metal-semiconductor-metal structures; optical waveguides; silicon; Si; bias voltages; carrier depletion; carrier lifetime; carrier sweepout; metal-semiconductor-metal junctions; metal-semiconductor-metal structure; photogenerated carriers; silicon waveguide; Charge carrier lifetime; Gold; Optical losses; Optical waveguides; Probes; Schottky barriers; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2015 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    7183808
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=733370