Title :
Frequency instability and phase noise characterization of an integrated chip-scale optomechanical oscillator
Author :
Yongjun Huang ; Jiagui Wu ; Xingsheng Luan ; Shu-Wei Huang ; Mingbin Yu ; Guoqiang Lo ; Dim-Lee Kwong ; Guangjun Wen ; Chee Wei Wong
Author_Institution :
Mesoscopic Opt. & Quantum Electron. Lab., Univ. of California at Los Angeles, Los Angeles, CA, USA
Abstract :
We characterize the frequency instability and single-sideband phase noise of chip-scale optomechanically-driven oscillators, with integrated Ge photoreceivers. At 400-μ\\ν, an open-loop frequency instability at 10-8 is observed, with -125 dBc/Hz phase noise at 10-kHz offset.
Keywords :
elemental semiconductors; frequency stability; germanium; integrated optics; integrated optoelectronics; micro-optomechanical devices; optical receivers; oscillators; phase noise; Ge; integrated chip-scale optomechanical oscillator; integrated photoreceivers; open-loop frequency instability; power 400 muW; single-sideband phase noise; Microelectronics; Nanostructures; Optics; Physics; Radiofrequency integrated circuits; Roads;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
