Title :
Development of testing technique of main parameters for two spectral ratios optical-electronic device
Author :
Tupikina, Nadezhda Y. ; Sypin, Eugene V. ; Lisakov, Sergey A. ; Pavlov, Andrey N. ; Leonov, Gennady V.
Author_Institution :
Biysk Technol. Inst., AltSTU, Biysk, Russia
fDate :
June 29 2015-July 3 2015
Abstract :
The techniques for determining of the main technical parameters of the two spectral ratios optical-electronic device are shown in the article. The testing technique for response time, angular field, temperature detection threshold and validity of decision-making are described.
Keywords :
optical testing; optoelectronic devices; angular field; decision-making; main technical parameters; optical-electronic device; response time; temperature detection threshold; testing technique; two spectral ratios; Explosions; Fires; Optical sensors; Sensitivity; Testing; Time factors; optical-electronic device; parameter; technique;
Conference_Titel :
Micro/Nanotechnologies and Electron Devices (EDM), 2015 16th International Conference of Young Specialists on
Conference_Location :
Erlagol
Print_ISBN :
978-1-4673-6718-9
DOI :
10.1109/EDM.2015.7184555
