DocumentCode
734980
Title
Identifying aging-aware representative paths in processors
Author
Sandionigi, Chiara ; Heron, Olivier
Author_Institution
Lab. de Calcul et Environ. de conception, CEA, Gif-sur-Yvette, France
fYear
2015
fDate
6-8 July 2015
Firstpage
32
Lastpage
33
Abstract
This paper proposes a method to select a set of paths representative of the behavior of a processor under NBTI conditions. The selected paths are the ones that are expected to fail first due to aging for any executed application.
Keywords
ageing; integrated circuit reliability; microprocessor chips; negative bias temperature instability; NBTI conditions; paths representative selection; processor aging aware representative path; Aging; Degradation; Delays; Program processors; Reliability; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
Conference_Location
Halkidiki
Type
conf
DOI
10.1109/IOLTS.2015.7229825
Filename
7229825
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