Title :
Identifying aging-aware representative paths in processors
Author :
Sandionigi, Chiara ; Heron, Olivier
Author_Institution :
Lab. de Calcul et Environ. de conception, CEA, Gif-sur-Yvette, France
Abstract :
This paper proposes a method to select a set of paths representative of the behavior of a processor under NBTI conditions. The selected paths are the ones that are expected to fail first due to aging for any executed application.
Keywords :
ageing; integrated circuit reliability; microprocessor chips; negative bias temperature instability; NBTI conditions; paths representative selection; processor aging aware representative path; Aging; Degradation; Delays; Program processors; Reliability; Stress;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
Conference_Location :
Halkidiki
DOI :
10.1109/IOLTS.2015.7229825
