Title :
Self-awareness and self-learning for resiliency in real-time systems
Author :
Tahoori, Mehdi B. ; Chatterjee, Abhijit ; Chakrabarty, Krishnendu ; Koneru, Abhishek ; Vijayan, Arunkumar ; Banerjee, Debashis
Author_Institution :
Karlsruhe Inst. of Technol., Karlsruhe, Germany
Abstract :
While the notion of self-awareness has a long history in biology, psychology, medicine, engineering and (more recently) computing, we are seeing the emerging need for self-awareness in the context of complex Systems-on-Chip that must address the often conflicting requirements of performance, resiliency, energy, cost, etc. in the face of highly dynamic operational behaviors coupled with process, environment, and workload variabilities. Unlike traditional Systems-on-Chip (SoCs), self-aware SoCs must deploy an intelligent co-design of the control, communication, and computing infrastructure that interacts with the physical environment in real-time in order to modify the systems behavior so as to adaptively achieve desired objectives and Quality-of-Service (QoS). Self-aware SoCs require a combination of ubiquitous sensing and actuation, health-monitoring, and self-learning to enable the SoCs adaptation over time and space. This special session targets self-learning and self-awareness in two domains. The first one is a self-learning runtime reliability prediction approach by reusing Design-for-Test (DfT) infrastructure. The other one discusses real-time systems and applications to wireless communication, signal processing and control.
Keywords :
design for testability; integrated circuit design; integrated circuit reliability; quality of service; real-time systems; system-on-chip; unsupervised learning; DfT infrastructure; QoS; SoC; biology; communication infrastructure; complex systems-on-chip; computing infrastructure; control infrastructure; design-for-test infrastructure; dynamic operational behaviors; engineering; intelligent codesign; medicine; psychology; quality-of-service; real-time systems; resiliency; runtime reliability prediction approach; self-awareness; self-learning; signal processing; wireless communication; workload variabilities; Aging; Delays; Hardware; Monitoring; Process control; Real-time systems; Software;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
Conference_Location :
Halkidiki
DOI :
10.1109/IOLTS.2015.7229845