Title : 
A 23mW face recognition accelerator in 40nm CMOS with mostly-read 5T memory
         
        
            Author : 
Dongsuk Jeon ; Qing Dong ; Yejoong Kim ; Xiaolong Wang ; Shuai Chen ; Hao Yu ; Blaauw, David ; Sylvester, Dennis
         
        
            Author_Institution : 
Univ. of Michigan, Ann Arbor, MI, USA
         
        
        
        
            Abstract : 
This paper presents a face recognition accelerator for HD (1280×720) images. The proposed design detects faces from the input image using cascaded classifiers. A SVM (Support Vector Machine) performs face recognition based on features extracted by PCA (Principal Component Analysis). Algorithm optimizations including a hybrid search scheme that reduces the workload for face detection by 12×. A new mostly-read 5T memory reduces bitcell area by 7.2% compared to a conventional 6T bitcell while achieving significantly better read reliability and voltage scalability due to a decoupled read path. The resulting design consumes 23mW while processing both face detection and recognition in real time at 5.5 frames/s throughput.
         
        
            Keywords : 
CMOS memory circuits; face recognition; feature extraction; image classification; optimisation; principal component analysis; search problems; support vector machines; CMOS; HD images; PCA; SVM; bitcell area; cascaded classifiers; decoupled read path; face detection; face recognition accelerator; feature extraction; hybrid search scheme; mostly-read 5T memory; power 23 mW; principal component analysis; read reliability; size 40 nm; support vector machine; voltage scalability; Face; Face detection; Face recognition; Feature extraction; Principal component analysis; Random access memory; Support vector machines;
         
        
        
        
            Conference_Titel : 
VLSI Circuits (VLSI Circuits), 2015 Symposium on
         
        
            Conference_Location : 
Kyoto
         
        
            Print_ISBN : 
978-4-86348-502-0
         
        
        
            DOI : 
10.1109/VLSIC.2015.7231322