Title :
Analysis and discussion of false triggering of Vce desaturation protection circuit in a T-type neutral point clamped inverter and its solutions
Author :
Yu Wu ; Yaojie Sun ; Yandan Lin
Abstract :
IGBT in a T-type inverter delivers unusual performance when accommodated with the conventional collector-emitter voltage (Vce) desaturation protection circuit. By analysing the switching behaviours in the corresponding control sequence, this study presents a false triggering failure phenomenon on the protection circuit. The phenomenon is theoretically analysed. It is aggravated at a larger load current and influenced by the capacitive effects in the antiparallel diode. Analysis done by the authors is validated in a three-phase 15 kW T-type inverter prototype. A false triggering of the protection circuit occurs when the current commutes among the insulated gate bipolar transistors (IGBTs) as a result of the IGBT characteristics being influenced. This study also puts forward a logic algorithm to provide guidance on hardware drive circuit or digital signal processor design depending on the analysis.
Keywords :
clamps; digital signal processing chips; driver circuits; insulated gate bipolar transistors; semiconductor diodes; switching convertors; IGBT; antiparallel diode; capacitive effect; collector-emitter voltage desaturation protection circuit; digital signal processor design; false triggering failure phenomenon; hardware drive circuit; insulated gate bipolar transistor; load current; logic algorithm; power 15 kW; switching behaviours analysis; three-phase T-type neutral point clamped inverter;
Journal_Title :
Power Electronics, IET
DOI :
10.1049/iet-pel.2013.0442