Title :
On Deploying Scan Chains for Data Storage in Test Compression Environment
Author :
Czysz, D. ; Mrugalski, G. ; Mukherjee, N. ; Rajski, J. ; Tyszer, J.
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
Abstract :
In this study the authors show how the interface between automatic test equipment (ATE) and on-chip decompression logic can be improved by a smart reuse of the scan chains. Storing the parent patterns of a modular decompression scheme in groups of scan chains avoids multiple loads from the ATE and thus reduces the test time. The presented algorithm for scan chain selection allows a flexible bandwidth management while preserving encoding efficiency and fault coverage.
Keywords :
automatic test equipment; computerised instrumentation; data compression; storage management; ATE; automatic test equipment; bandwidth management; data storage; encoding efficiency; fault coverage; modular decompression scheme; on-chip decompression logic; scan chain; test compression environment; Automatic test equipment; Data storage; Encoding; Logic gates; Multiplexing; Phase shifters; Storage automation; System-on-a-chip; Channel bandwidth management; embedded deterministic test; scan-based designs; test data compression; test interface; tri-modal compression;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDT.2012.2184072
