DocumentCode :
737781
Title :
Design and Performance Analysis of a 866-MHz Low-Power Optimized CMOS LNA for UHF RFID
Author :
Li, Jie ; Hasan, S. M. Rezaul
Author_Institution :
Center for Res. in Analog & VLSI Microsyst. dEsign (CRAVE), Massey Univ., Albany, New Zealand
Volume :
60
Issue :
5
fYear :
2013
fDate :
5/1/2013 12:00:00 AM
Firstpage :
1840
Lastpage :
1849
Abstract :
An optimized 866 MHz CMOS LNA for UHF radio-frequency identification reader is presented. It achieves simultaneous impedance and minimum Fmin noise matching at a very low-power drain of 850 μW from a 0.7-V supply voltage. Compared to other GHz LNA designs, this UHF LNA design using sub-1 V supply voltage is quite challenging due to the inductor size and bias drain-related noise factor degradation. The LNA was fabricated using the 130-nm IBM CMOS process. Compared to previously reported narrow-band LNA designs, inclusion of the finite gds effect is found to improve the nanometric design optimization. The low-cost packaged LNA was tested using external lumped element and microstrip line matching. The LNA delivered a power gain (S21) of ≈17 dB and an input power reflection (S11 @ 866 MHz) of ≈ -30 dB. It had a minimum pass-band noise figure of around 2.2 dB and a third-order input-referred intercept point of ≈ -11.5 dBm.
Keywords :
CMOS integrated circuits; UHF amplifiers; inductors; low noise amplifiers; low-power electronics; lumped parameter networks; microstrip lines; optimisation; radiofrequency identification; IBM CMOS process; UHF RFID; UHF radiofrequency identification reader; bias drain-related noise factor degradation; external lumped element; frequency 866 MHz; inductor size; low-cost packaged LNA; low-power drain; low-power optimized CMOS LNA; microstrip line matching; nanometric design optimization; narrow-band LNA designs; noise matching; power 850 muW; simultaneous impedance; size 130 nm; voltage 0.7 V; voltage 1 V; Impedance matching; Inductors; Logic gates; Noise; Optimization; Radiofrequency identification; Resistance; CMOS LNA; VLSI; impedance matching; intelligent wireless systems; narrow-band; noise matching; radio-frequency identification (RFID);
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2012.2190953
Filename :
6169991
Link To Document :
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