Title : 
Power-Up Sequence Control for MTCMOS Designs
         
        
            Author : 
Shi-Hao Chen ; Youn-Long Lin ; Chao, Mango C.-T
         
        
            Author_Institution : 
Design Service Div., GLOBAL UNICHIP CORP., Hsinchu, Taiwan
         
        
        
        
        
            fDate : 
3/1/2013 12:00:00 AM
         
        
        
        
            Abstract : 
Power gating is effective for reducing standby leakage power as multi-threshold CMOS (MTCMOS) designs have become popular in the industry. However, a large inrush current and dynamic IR drop may occur when a circuit domain is powered up with MTCMOS switches. This could in turn lead to improper circuit operation. We propose a novel framework for generating a proper power-up sequence of the switches to control the inrush current of a power-gated domain while minimizing the power-up time and reducing the dynamic IR drop of the active domains. We also propose a configurable domino-delay circuit for implementing the sequence. Experimental results based on state-of-the-art industrial designs demonstrate the effectiveness of the proposed framework in limiting the inrush current, minimizing the power-up time, and reducing the dynamic IR drop. Results further confirm the efficiency of the framework in handling large-scale designs with more than 80 K power switches and 100 M transistors.
         
        
            Keywords : 
CMOS integrated circuits; electric current control; integrated circuit design; power control; power semiconductor switches; MTCMOS designs; MTCMOS switches; configurable domino-delay circuit; dynamic IR drop reduction; inrush current control; multithreshold CMOS designs; power gating; power-up sequence; power-up sequence control; standby leakage power; Capacitance; Load modeling; Logic gates; Rails; Resistance; Surges; Transistors; Dynamic IR; inrush current; low power design; multi-threshold CMOS (MTCMOS); power gating; power-up sequence; ramp-up time;
         
        
        
            Journal_Title : 
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TVLSI.2012.2187689