Title :
Architecture and Design Flow for a Highly Efficient Structured ASIC
Author :
Man-Ho Ho ; Yan-Qing Ai ; Chau, T.C.-P. ; Yuen, S.C.L. ; Chiu-Sing Choy ; Leong, Philip H. W. ; Kong-Pang Pun
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, China
fDate :
3/1/2013 12:00:00 AM
Abstract :
As fabrication process technology continues to advance, mask set costs have become prohibitively expensive. Structured application specific integrated circuits (sASICs) offer a middle ground in price and performance between ASICs and field-programmable gate arrays (FPGAs) by sharing masks across different designs. In this paper, two sASIC architectures are proposed, the first being based on three-input lookup-tables, and the second on AOI22 gates. The sASICs are programmed using a standard-cell compatible design flow. They are customized using a minimum of three masks, i.e., two metals and one via. The area and delay of the sASIC are compared with ASICs and FPGAs. Results over a set of benchmark circuits show that our AOI22-based sASIC had an average of 1.76x/1.41x increase in area/delay compared to ASICs, a considerable improvement compared with the 26.56x/5.09x increase for FPGAs. This is, to the best of our knowledge, the best performance reported in the literature for a practical sASIC. A prototype using the sASIC was fabricated using a universal machine control 0.13-μm mixed-mode/RF process. It was fully verified using scan and functional tests, and used in a demonstration system.
Keywords :
application specific integrated circuits; field programmable gate arrays; integrated circuit design; integrated circuit testing; masks; table lookup; AOI22 gates; FPGA; benchmark circuits; demonstration system; fabrication process technology; field-programmable gate arrays; functional tests; highly efficient structured design flow ASIC; mask set costs; middle ground in price; mixed-mode-RF process; sASIC architectures; scan test; size 0.13 mum; standard-cell compatible design flow; structured application specific integrated circuits; three-input lookup-tables; universal machine control; Application specific integrated circuits; Fabrics; Field programmable gate arrays; Libraries; Logic gates; Pins; Routing; Application-specific integrated circuit (ASIC); area-delay comparison; field-programmable gate array (FPGA); structured-ASIC (sASIC); via-programmable;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2012.2190478