Title : 
A Fault-Tolerant Parallel Structure of Single-Phase Full-Bridge Rectifiers for a Wound-Field Doubly Salient Generator
         
        
            Author : 
Zhihui Chen ; Ran Chen ; Zhe Chen
         
        
            Author_Institution : 
Jiangsu Key Lab. of New Energy Generation & Power Conversion, Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
         
        
        
        
        
        
        
            Abstract : 
The fault-tolerance design is widely adopted for high-reliability applications. In this paper, a parallel structure of single-phase full-bridge rectifiers (FBRs) (PS-SPFBR) is proposed for a wound-field doubly salient generator. The analysis shows the potential fault-tolerance capability of the PS-SPFBR over the common three-phase FBR. The normal no-load and loading operations are discussed, and the fault-tolerance ability is analyzed. A doubly salient generator prototype is built and tested; the machine is also modeled and simulated with the finite element method. The results obtained from simulation are in good agreement with that from the experiments under both normal no-load and loading operations. The impacts of a single-phase open-circuit fault have been discussed, and the fault-tolerance ability has been demonstrated.
         
        
            Keywords : 
fault tolerance; finite element analysis; permanent magnet generators; rectifying circuits; PS-SPFBR; doubly salient permanent magnet machine; fault-tolerant parallel structure; finite element method; high-reliability applications; single-phase full-bridge rectifiers; single-phase open-circuit fault; three-phase FBR; wound-field doubly salient generator; Fault tolerance; Fault tolerant systems; Loading; Prototypes; Rectifiers; Stators; Windings; Doubly salient machines (DSMs); fault tolerance; finite element methods (FEMs); parallel structure of full-bridge rectifier (FBR); voltage ripple coefficient;
         
        
        
            Journal_Title : 
Industrial Electronics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TIE.2012.2203773