Title :
Open-Circuit Fault Diagnosis in PMSG Drives for Wind Turbine Applications
Author :
Freire, Nuno M. A. ; Estima, Jorge O. ; Marques Cardoso, Antonio J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
Abstract :
Condition monitoring and fault diagnosis are currently considered crucial means to increase the reliability and availability of wind turbines and, consequently, to reduce the wind energy cost. With similar goals, direct-drive wind turbines based on permanent magnet synchronous generators (PMSGs) with full-scale power converters are an emerging and promising technology. Numerous studies show that power converters are a significant contributor to the overall failure rate of modern wind turbines. In this context, open-circuit fault diagnosis in the two power converters of a PMSG drive for wind turbine applications is addressed in this paper. A diagnostic method is proposed for each power converter, allowing real-time detection and localization of multiple open-circuit faults. The proposed methods are suitable for integration into the drive controller and triggering remedial actions. In order to prove the reliability and effectiveness of the proposed fault diagnostic methods, several simulation and experimental results are presented.
Keywords :
condition monitoring; electric drives; failure analysis; fault diagnosis; permanent magnet generators; power convertors; synchronous generators; wind power plants; wind turbines; PMSG drives; condition monitoring; failure rate; full-scale power converters; multiple open-circuit fault localization; open-circuit fault diagnosis; permanent magnet synchronous generators; real-time detection; wind turbine applications; Circuit faults; Fault detection; Fault diagnosis; Generators; Insulated gate bipolar transistors; Vectors; Wind turbines; Condition monitoring; fault diagnosis; multiple power switch open-circuit faults; permanent magnet machines; semiconductor device reliability; wind power generation;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2012.2207655