Title :
Ga-Doped ZnO Nanosheet Structure-Based Ultraviolet Photodetector by Low-Temperature Aqueous Solution Method
Author :
Yi-Hsing Liu ; Sheng-Joue Young ; Liang-Wen Ji ; Shoou-Jinn Chang
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
The fabrication of Ga-doped zinc oxide (GZO) nanosheets on a glass substrate was done using the aqueous solution method. A GZO nanosheet metal-semiconductor-metal ultraviolet (UV) photodetector (PD) was also fabricated. The average length and diameter of the GZO nanosheets were 1.28 μm and ~19 nm, respectively. The energy dispersive X-ray spectrum determined that the Ga-doped sample contains ~35% at.%. The UV-to-visible rejection ratio of the sample is ~36.1 when biased at 1 V, and the fabricated UV PD is visible-blind with a sharp cutoff at 370 nm. The photocurrent and dark-current constant ratio of the fabricated PD was ~14193 when biased at 1 V. The transient time constants measured during the rise time and the fall time were 2.45 and 4 s, respectively.
Keywords :
II-VI semiconductors; X-ray chemical analysis; gallium; metal-semiconductor-metal structures; nanofabrication; nanosensors; nanostructured materials; photoconductivity; photodetectors; photoemission; temperature measurement; temperature sensors; ultraviolet detectors; wide band gap semiconductors; zinc compounds; UV PD; UV-to-visible rejection ratio; ZnO:Ga; dark-current constant ratio; energy dispersive X-ray spectrum; glass substrate; low-temperature aqueous solution method; nanofabrication; nanosheet metal-semiconductor-metal structure; photocurrent constant ratio; size 1.28 mum; time 2.45 s; time 4 s; ultraviolet photodetector; voltage 1 V; wavelength 370 nm; II-VI semiconductor materials; Lighting; Nanobioscience; Partial discharges; Photodetectors; Semiconductor device measurement; Zinc oxide; Ga-doped zinc oxide (GZO) nanosheet; photodetector (PD); photodetector (PD).;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2015.2457441