Title :
Reliability Calculation of Multilevel Converters: Theory and Applications
Author :
Richardeau, Frederic ; Pham, T.T.L.
Author_Institution :
Lab. Plasma et Conversion d´Energie, Univ. of Toulouse, Toulouse, France
Abstract :
Multilevel converters have many power devices and drivers. Thus, a direct reliability calculation based only on the first failure occurrence on one of the components clearly leads them to be devalued compared to two-level converters. However, taking into account that symmetrical multilevel converters such as the X-level active neutral point clamped (ANPC) family are based on imbricated and/or stacked switching cells on the one hand, with an additional center tap at the dc bus in three-phase operation on the other hand, several redundancies clearly appear which can be managed to increase the global reliability. For the first time, a general and theoretical methodology used to calculate reliability laws and failure rates and applied to compare two-, three-, and five-level topologies is proposed. Results show that the fault handling of three- and five-level three-phase topologies permits a great increase in reliability over a “relatively” short time duration, in addition to other benefits.
Keywords :
power convertors; reliability; active neutral point clamped family; dc bus; failure rates; fault handling; five-level topologies; multilevel converters reliability calculation; power devices; power drivers; reliability laws; three-level topologies; three-phase operation; three-phase topologies; two-level converters; two-level topologies; Insulated gate bipolar transistors; Inverters; Power system reliability; Redundancy; Reliability theory; Topology; Fail-safe capability; fault-tolerant capability; multilevel converters; reliability diagram; reliability modeling;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2012.2211315