DocumentCode :
739498
Title :
Characterization of CMOS Metamaterial Transmission Line by Compact Fractional-Order Equivalent Circuit Model
Author :
Chang Yang ; Hao Yu ; Yang Shang ; Wei Fei
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Volume :
62
Issue :
9
fYear :
2015
Firstpage :
3012
Lastpage :
3018
Abstract :
In this paper, a compact fractional-order equivalent circuit model is developed to characterize three types of metamaterial transmission lines (T-lines): 1) composite right-/left-handed transmission line T-line; 2) split ring resonator T-line; and 3) complimentary split ring resonator T-line, all designed in 65-nm CMOS process at millimeter-wave frequency region. With the consideration of frequency-dependent dispersion loss and nonquasistatic effect, the proposed fractional-order equivalent circuit model can compactly characterize the measured results with good agreement up to 325 GHz.
Keywords :
CMOS integrated circuits; microwave metamaterials; microwave resonators; multiconductor transmission lines; CMOS metamaterial transmission line; CMOS process; compact fractional-order equivalent circuit model; composite right-/left-handed transmission line T-line; millimeter-wave frequency region; size 65 nm; split ring resonator T-line; CMOS integrated circuits; Dispersion; Integrated circuit modeling; Load modeling; Mathematical model; Metamaterials; Semiconductor device modeling; CMOS on-chip metamaterial transmission lines (T-lines); fractional-order equivalent circuit model; fractional-order equivalent circuit model.;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2458931
Filename :
7175027
Link To Document :
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